Reconfigurable Scan Architecture for High Diagnostic Resolution

Scan chain diagnosis is essential to solving yield-reduction problem caused by the miniaturization of manufacturing process. The accurate scan faults that frequently occur in initial process vital for rapidly improving yield. Moreover, importance with a high resolution multiple increasing because early stages process, further cost physical failure analysis. Although can be diagnosed existing methods, diagnostic difficult achieve (where many occur) due rapid increase number fault candidates as actual circuit increases. In this paper, novel reconfigurable architecture reconfigures paths and test algorithm uses are proposed reduce faults. Experimental results indicate method achieves higher than conventional methods. addition, reduces routing overhead partitioning.